Status of the PolLux STXM Beamline.
نویسندگان
چکیده
منابع مشابه
Low-dose, high-resolution and high-efficiency ptychography at STXM beamline of SSRF
Ptychography is a diffraction-based X-ray microscopy method that can image extended samples quantitatively while remove the resolution limit imposed by image-forming optical elements. As a natural extension of scanning transmission X-ray microscopy (STXM) imaging method, we developed soft X-ray ptychographic coherent diffraction imaging (PCDI) method at the STXM endstation of BL08U beamline of ...
متن کاملthe relationship between using language learning strategies, learners’ optimism, educational status, duration of learning and demotivation
with the growth of more humanistic approaches towards teaching foreign languages, more emphasis has been put on learners’ feelings, emotions and individual differences. one of the issues in teaching and learning english as a foreign language is demotivation. the purpose of this study was to investigate the relationship between the components of language learning strategies, optimism, duration o...
15 صفحه اولefl students gender and socioeconomic status: the use of politeness strategies in the first and second languages
within the components of communicative competence, a special emphasis is put on the “rules of politeness,” specifically the politeness strategies (brown and levinson, 1978) that speakers deploy when performing the request speech act. this is because the degree of imposition that making a request places upon one’s interlocutor(s) has been seen to be influenced by several factors among which, as ...
PolLux: a new facility for soft x-ray spectromicroscopy at the Swiss Light Source.
We report on the successful installation and operation of a scanning transmission x-ray microspectroscope (STXM) at the PolLux facility at the Swiss Light Source. This integration of an advanced STXM with improved sample handling capabilities and a novel beamline provides unique capabilities. PolLux uses linearly or circularly polarized x-rays from a bending magnet with an extended photon energ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618014617